Synthesis of circuits with low-cost concurrent error detection based on Bose-Lin codes

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 309-315

  Das, D ^a   Touba, N A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); COMBINATORIAL CIRCUITS; COST ACCOUNTING; ERROR DETECTION; FLOWCHARTING; INTEGRATED CIRCUIT TESTING;

SELF CHECKING CIRCUITS;

SEQUENTIAL CIRCUITS;

EID: 0032319933     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)