High-order Nystrom schemes for efficient 3-D capacitance extraction

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1998, Pages 178-185

  Kapur, Sharad ^a   Long, David E ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTATIONAL METHODS; MATHEMATICAL MODELS; MATRIX ALGEBRA; SEMICONDUCTOR DEVICE STRUCTURES;

DISCRETIZATION; NYSTROM METHOD;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032319736     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/288548.288604     Document Type: Conference Paper

References (15)