Test rate effects on the mechanical behavior of thin aluminum films

Materials Research Society Symposium - Proceedings

Volumn 522, Issue , 1998, Pages 281-284

  Moody, N R ^a   Strojny, A ^a   Medlin, D ^a   Guthrie, S ^a   Gerberich, W W ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; NANOTECHNOLOGY; PLASTICITY TESTING; SAPPHIRE; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION;

NANOINDENTATION; SCANNING PROBE MICROSCOPY; TEST RATE EFFECTS;

METALLIC FILMS;

EID: 0032319617     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)