Correlations between path delays and the accuracy of performance prediction

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 801-808

  Huisman, Leendert M ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

PATH DELAY;

INTEGRATED CIRCUIT TESTING;

EID: 0032319091     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)