Multisignal modeling for diagnosis, FMECA, and reliability

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

Volumn 3, Issue , 1998, Pages 3026-3031

  Deb, Somnath ^a   Ghoshal, Sudipto ^a   Mathur, Amit ^a   Shrestha, Roshan ^a   Pattipati, Krishna R ^a  

^a QUALTECH SYSTEMS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; KNOWLEDGE REPRESENTATION; MATHEMATICAL MODELS; RELIABILITY;

MULTISIGNAL MODELING;

SYSTEMS ANALYSIS;

EID: 0032318791     PISSN: 08843627     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)