Corner and rooftop diffraction in radiowave propagation prediction tools: A review

IEEE Vehicular Technology Conference

Volumn 1, Issue , 1998, Pages 515-519

  Demetrescu, C ^a   Constantinou, C C ^a   Mehler, M J ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; RAY TRACING;

DIFFRACTION COEFFICIENTS;

RADIO TRANSMISSION;

EID: 0032318766     PISSN: 07400551     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)