Structured fault-detection and diagnosis using finite-state automaton

IECON Proceedings (Industrial Electronics Conference)

Volumn 3, Issue , 1998, Pages 1667-1672

  Ramkumar, K B ^a   Philips, Patrick ^a   Presig, Heinz A ^a   Ho, W K ^a   Lim, K W ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TREE ANALYSIS; FINITE AUTOMATA; MATHEMATICAL MODELS; SCADA SYSTEMS; STATE SPACE METHODS;

STRUCTURED FAULT DETECTION;

DISCRETE TIME CONTROL SYSTEMS;

EID: 0032317840     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)