Semiconductor manufacturing process monitoring using Built-In Self-Test for embedded memories

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 872-881

  Schanstra, Ivo ^a   Lukita, Dharmajaya ^a   van de Goor, Ad J ^a   Veelenturf, Kees ^a   van Wijnen, Paul J ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED MEMORY;

ALGORITHMS; BUILT-IN SELF TEST; EMBEDDED SYSTEMS; FAILURE ANALYSIS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR STORAGE;

RANDOM ACCESS STORAGE;

EID: 0032317506     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743277     Document Type: Conference Paper

References (10)