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Volumn 43, Issue 12-13, 1998, Pages 1843-1850
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Electrochemical and X-ray investigations on the system (Cu,Hg,Zn) with regard to the Cu-Zn interference
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Author keywords
Amalgam electrode; Cyclic voltammetry; Diffractometry; Nanocrystalline "CuZn" compound; Potentiometry
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Indexed keywords
CHEMICAL ANALYSIS;
COPPER;
CYCLIC VOLTAMMETRY;
ELECTRIC VARIABLES MEASUREMENT;
ELECTROCHEMICAL ELECTRODES;
INTERMETALLICS;
NANOSTRUCTURED MATERIALS;
PHASE COMPOSITION;
SATURATION (MATERIALS COMPOSITION);
X RAY DIFFRACTION ANALYSIS;
ZINC;
AMALGAM ELECTRODES;
COULOMETRY;
NANOCRYSTALLINES;
POTENTIOMETRY;
SYSTEMS (METALLURGICAL);
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EID: 0032317134
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(97)00302-2 Document Type: Article |
Times cited : (5)
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References (18)
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