Undetectable fault removal of sequential circuits based on unreachable states

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 176-181

  Yotsuyanagi, H ^a   Kinoshita, K ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT THEORY; ELECTRIC FAULT LOCATION; IDENTIFICATION (CONTROL SYSTEMS); INTEGRATED CIRCUIT TESTING;

FAULT REMOVAL;

SEQUENTIAL CIRCUITS;

EID: 0032316912     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)