Complete method for Ebd correction by series resistance characterization

International Integrated Reliability Workshop Final Report

Volumn , Issue , 1998, Pages 33-38

  Monroe, David K ^a   Swanson, Scot E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC RESISTANCE; LEAKAGE CURRENTS; MATHEMATICAL MODELS; OXIDES;

FOWLER-NORDHEIM LEAKAGE MODEL; SERIES RESISTANCE;

MOS CAPACITORS;

EID: 0032316880     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)