ESD and latch-up characteristics of semiconductor device with thin epitaxial substrate

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 199-207

  Suzuki, Teruo ^a   Sekino, Satoshi ^a   Ito, Seigo ^a   Monma, Hideo ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC DISCHARGES; ELECTROSTATICS;

ELECTROSTATIC DISCHARGE IMMUNITY; LATCH-UP CHARACTERISTICS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0032316294     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)