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Volumn , Issue , 1998, Pages 57-68
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Concerning reliability modeling of connectors
a
a
AMP Inc
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
DEGRADATION;
ELECTRIC CONTACTS;
ELECTRIC RESISTANCE;
FAILURE ANALYSIS;
MATHEMATICAL MODELS;
RELIABILITY;
CONNECTOR RELIABILITY;
CONTACT RESISTANCE;
ELECTRIC CONNECTORS;
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EID: 0032316153
PISSN: 03614395
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (18)
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References (19)
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