-
1
-
-
0024733223
-
Low temperature fabrication of high mobility TFT's for large area LCD's,"
-
vol. 36, pp. 1929-1933, 1989.
-
T. Serikawa, S. Shirai, A. Okamoto, and S. Suyama, Low temperature fabrication of high mobility TFT's for large area LCD's," IEEE Trans. Electron Devices, vol. 36, pp. 1929-1933, 1989.
-
IEEE Trans. Electron Devices
-
-
Serikawa, T.1
Shirai, S.2
Okamoto, A.3
Suyama, S.4
-
2
-
-
0025749747
-
CMOS self-aligned low temperature poly-Si TFT's fabricated by laser annealing of poly-Si films," in
-
91, pp. 638-640.
-
T. Hashizume étal., CMOS self-aligned low temperature poly-Si TFT's fabricated by laser annealing of poly-Si films," in Ext. Abstr. SSDM'91, pp. 638-640.
-
Ext. Abstr. SSDM'
-
-
Hashizume Étal, T.1
-
3
-
-
0024908311
-
"High performance TFT's fabricated by XeCl excimer laser annealing of hydrogenated amorphous silicon film," IEEE Trans
-
vol. 36, pp. 2868-2872, 1989. [4] Y. Matsueda et al., Low temperature poly-Si TFT-LCD with integrated
-
K. Sera et al., "High performance TFT's fabricated by XeCl excimer laser annealing of hydrogenated amorphous silicon film," IEEE Trans. Electron Devices, vol. 36, pp. 2868-2872, 1989. [4] Y. Matsueda et al., Low temperature poly-Si TFT-LCD with integrated
-
Electron Devices
-
-
Sera, K.1
-
4
-
-
0024753175
-
XeCl excimer laser annealing used to fabricate poly-Si TFT's,"
-
Jpn. J. Appl. Phys., vol. 28, pp. 1789-1793, 1989.
-
6-bit digital data drivers," in SID'96 Dig., 1996, pp. 21-24. [5] T. Sameshima, M. Hara, and S. Usui, XeCl excimer laser annealing used to fabricate poly-Si TFT's," Jpn. J. Appl. Phys., vol. 28, pp. 1789-1793, 1989.
-
SID'96 Dig., 1996, Pp. 21-24. [5] T. Sameshima, M. Hara, and S. Usui
-
-
-
5
-
-
0024733525
-
A full-color LCD addressed by poly-Si TFT's fabricated below 450°C,"
-
vol. 36, pp. 1934-1939, 1989.
-
M. Yuki, K. Masumo, and M. Kunigita, A full-color LCD addressed by poly-Si TFT's fabricated below 450°C," IEEE Trans. Electron Devices, vol. 36, pp. 1934-1939, 1989.
-
IEEE Trans. Electron Devices
-
-
Yuki, M.1
Masumo, K.2
Kunigita, M.3
-
6
-
-
0029246215
-
High performance poly-Si TFT fabricated using pulsed laser annealing and remote plasma CVD with low temperature processing,"
-
vol. 42, pp. 251-257, 1995.
-
A. Kohno et al, High performance poly-Si TFT fabricated using pulsed laser annealing and remote plasma CVD with low temperature processing," IEEE Trans. Electron Devices, vol. 42, pp. 251-257, 1995.
-
IEEE Trans. Electron Devices
-
-
Kohno, A.1
-
7
-
-
0031170162
-
A novel self- Aligned polycrystalline silicon thin-film transistor using suicide layers,"
-
J. I. Ryu, H. C. Kirn, S. K. Kirn, and J. Jang, A novel self- aligned polycrystalline silicon thin-film transistor using suicide layers," IEEE Electron. Device Lett., vol. 18, pp. 272-274, 1997.
-
IEEE Electron. Device Lett., Vol. 18, Pp. 272-274, 1997.
-
-
Ryu, J.I.1
Kirn, H.C.2
Kirn, S.K.3
Jang, J.4
-
8
-
-
0023962683
-
Formation of source and drain region for a-Si : H thin-film transistors by low-energy ion doping technique,"
-
vol. 9, pp. 90-93, 1988.
-
Y. Yoshida, K. Setsune, and T. Hirao, Formation of source and drain region for a-Si : H thin-film transistors by low-energy ion doping technique," IEEE Electron. Device Lett., vol. 9, pp. 90-93, 1988.
-
IEEE Electron. Device Lett.
-
-
Yoshida, Y.1
Setsune, K.2
Hirao, T.3
-
9
-
-
0030166754
-
Low temperature polycrystalline silicon thin film transistor with silicon nitride ion stopper,"
-
vol. 17, p. 258, 1996.
-
K. H. Lee, Y. M. Jhon, H. J. Cha, and J. Jang, Low temperature polycrystalline silicon thin film transistor with silicon nitride ion stopper," IEEE Electron. Device Lett., vol. 17, p. 258, 1996.
-
IEEE Electron. Device Lett.
-
-
Lee H, K.1
Jhon, Y.M.2
Cha, H.J.3
Jang, J.4
-
10
-
-
0026818616
-
Conduction mechanism of leakage current observed in metal-oxide-semiconductor transistors and poly-Si thin film transistors,"
-
vol. 31, pp. 206-209, 1992.
-
M. Yazaki, S. Takenaka, and H. Oshima, Conduction mechanism of leakage current observed in metal-oxide-semiconductor transistors and poly-Si thin film transistors," Jpn. J. Appl. Phys., vol. 31, pp. 206-209, 1992.
-
Jpn. J. Appl. Phys.
-
-
Yazaki, M.1
Takenaka, S.2
Oshima, H.3
-
12
-
-
33747071314
-
Crystallization of silicon ion implanted LPCVD amorphous silicon films for high performance poly-TFT,"
-
vol. 182, pp. 107-113, 1990.
-
I.-W. Wu et ai, Crystallization of silicon ion implanted LPCVD amorphous silicon films for high performance poly-TFT," Mat. Res. Soc. P roc., vol. 182, pp. 107-113, 1990.
-
Mat. Res. Soc. P Roc.
-
-
Wu, I.-W.1
-
13
-
-
0020250680
-
"Single-crystal silicon transistors in lasercrystallized thin films on bulk glass," IEEE Electron
-
3, pp. 369-372, 1982.
-
N. M. Johnson et al., "Single-crystal silicon transistors in lasercrystallized thin films on bulk glass," IEEE Electron. Devices Lett., vol. EDL-3, pp. 369-372, 1982.
-
Devices Lett., Vol. EDL
-
-
Johnson, N.M.1
-
14
-
-
33747081450
-
Sub-//m poly-Si TFT's for low-voltage circuit applications," in
-
97, Tokyo, Japan, pp. 95-98.
-
M. Hatano, H. Akimoto, T. Sakai, and H. Ishida, Sub-//m poly-Si TFT's for low-voltage circuit applications," in Tech. Dig. AMLCD'97, Tokyo, Japan, pp. 95-98.
-
Tech. Dig. AMLCD'
-
-
Hatano, M.1
Akimoto, H.2
Sakai, T.3
Ishida, H.4
-
15
-
-
0022119783
-
Anomalous leakage current in LPCVD polysilicon MOSFET's,"
-
32, pp. 1878-1885, 1985.
-
J. G. Possum, A. O. Conde, H. Shichijo, and S. K. Banerjee, Anomalous leakage current in LPCVD polysilicon MOSFET's," IEEE Trans. Electron. Devices, Vol. ED32, pp. 1878-1885, 1985.
-
IEEE Trans. Electron. Devices, Vol. ED
-
-
Possum, J.G.1
Conde, A.O.2
Shichijo, H.3
Banerjee, S.K.4
-
16
-
-
0012498210
-
Temperature dependent leakage currents in polycrystalline silicon thin film transistors,"
-
vol. 81, pp. 8084-8090, 1997.
-
C. H. Kim, K. S. Sohn, and J. Jang, Temperature dependent leakage currents in polycrystalline silicon thin film transistors," J. Appl. Phys., vol. 81, pp. 8084-8090, 1997.
-
J. Appl. Phys.
-
-
Kim, C.H.1
Sohn, K.S.2
Jang, J.3
-
17
-
-
84945714601
-
"Characteristics and three-dimensional integration of MOSFET's in small-grain LPCVD polycrystalline silicon," IEEE Trans
-
32, pp. 258-281, 1985.
-
S. D. S. Malhi et al., "Characteristics and three-dimensional integration of MOSFET's in small-grain LPCVD polycrystalline silicon," IEEE Trans. Electron Devices, Vol. ED32, pp. 258-281, 1985.
-
Electron Devices, Vol. ED
-
-
Malhi, S.D.S.1
|