Defect level prediction for IDDQ testing

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 900-909

  Okuda, Yukio ^a   Kubota, Isao ^a   Watanabe, Masahiro ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRIC CURRENTS; INTEGRATED CIRCUIT MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

QUIESCENT CURRENT TESTING; STUCK-AT-FAULT (SAF) MODELS;

INTEGRATED CIRCUIT TESTING;

EID: 0032315776     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)