P4 probe card - a solution for at-speed, high density, wafer probing

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 836-842

  Pandey, Rajiv ^a   Higgins, Dan ^a  

^a Cerprobe Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOLITHOGRAPHIC PATTERN PLATED PROCESS; PROBE CARD TECHNOLOGY;

BANDWIDTH; CROSSTALK; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; PHOTOLITHOGRAPHY; PROBES;

INTEGRATED CIRCUIT TESTING;

EID: 0032315775     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743271     Document Type: Conference Paper

References (6)