Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3558, Issue , 1998, Pages 491-497

  Li, Hui ^a   Lu, Zukang ^a   Xie, Shusen ^a   Lin, Lei ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DIVIDING CIRCUITS; LASER BEAMS; LENSES; LIGHT POLARIZATION; LIGHT REFLECTION; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; PRISMS; SIGNAL RECEIVERS;

FRESNEL FORMULA; SPECULAR REFLECTIVITY; TOTAL INTERNAL REFLECTION;

REFRACTIVE INDEX;

EID: 0032315632     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)