FakeFault: A silicon debug software tool for microprocessor embedded memory arrays

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 727-732

  Kwon, Young Jun ^a   Mathew, Ben ^a   Hao, Hong ^a  

^a HEWLETT PACKARD ENTERPRISE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER SOFTWARE; DATA STORAGE EQUIPMENT; EMBEDDED SYSTEMS; MICROPROCESSOR CHIPS; SEMICONDUCTING SILICON; SEMICONDUCTOR STORAGE;

SOFTWARE PACKAGE FAKEFAULT;

INTEGRATED CIRCUIT TESTING;

EID: 0032315255     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)