-
1
-
-
0001454097
-
Surface Brillouin scattering from phonons
-
Horton GK, Maradudin AA, editors. Amsterdam: North Holland
-
Nizzoli F, Sandercock JR. Surface Brillouin scattering from phonons. In:Horton GK, Maradudin AA, editors. Dynamical properties of solids. Amsterdam: North Holland, 1990:281-335.
-
(1990)
Dynamical Properties of Solids
, pp. 281-335
-
-
Nizzoli, F.1
Sandercock, J.R.2
-
2
-
-
0000194247
-
Surface acoustic wave studies on nickel using Brillouin scattering and scanning acoustic microscope
-
Mendik M, Sathish S, Kulik A, Gremaud G. Wachter P. Surface acoustic wave studies on nickel using Brillouin scattering and scanning acoustic microscope. J Appl Phys 1992;71:2830-4.
-
(1992)
J Appl Phys
, vol.71
, pp. 2830-2834
-
-
Mendik, M.1
Sathish, S.2
Kulik, A.3
Gremaud, G.4
Wachter, P.5
-
3
-
-
36549095189
-
Elastic and vibrational properties of nickel films measured by surface Brillouin scattering
-
Jorna R, Visser J, Bortolani V, Nizzoli F. Elastic and vibrational properties of nickel films measured by surface Brillouin scattering. J Appl Phys 1989;65:718-25.
-
(1989)
J Appl Phys
, vol.65
, pp. 718-725
-
-
Jorna, R.1
Visser, J.2
Bortolani, V.3
Nizzoli, F.4
-
4
-
-
0000364761
-
Surface Brillouin scattering - extending surface wave measurements to 20 GHz
-
Briggs A, editor. New York: Plenum Press
-
Mutti P, Bottani CE, Ghislotti G, Beghi M, Briggs GAD, Sandercock JR. Surface Brillouin scattering - extending surface wave measurements to 20 GHz. In:Briggs A, editor. Advances in acoustic microscopy, vol.1. New York: Plenum Press 1978:249-300.
-
(1978)
Advances in Acoustic Microscopy
, vol.1
, pp. 249-300
-
-
Mutti, P.1
Bottani, C.E.2
Ghislotti, G.3
Beghi, M.4
Briggs, G.A.D.5
Sandercock, J.R.6
-
5
-
-
0000218403
-
Brillouin scattering measurements of surface-acoustic-wave velocities in silicon at high temperatures
-
Stoddart PR, Comins JD, Every AG. Brillouin scattering measurements of surface-acoustic-wave velocities in silicon at high temperatures. Phys Rev B 1995;51:17574-8.
-
(1995)
Phys Rev B
, vol.51
, pp. 17574-17578
-
-
Stoddart, P.R.1
Comins, J.D.2
Every, A.G.3
-
6
-
-
0005417919
-
Theory of inelastic light scattering by acoustic phonons in an opaque crystal
-
Subbaswamy KR, Maradudin AA. Theory of inelastic light scattering by acoustic phonons in an opaque crystal. Phys Rev B 1978;18:4181-99.
-
(1978)
Phys Rev B
, vol.18
, pp. 4181-4199
-
-
Subbaswamy, K.R.1
Maradudin, A.A.2
-
7
-
-
0024684810
-
Initial growth and epitaxy of PVD TiN layers on austenitic steel
-
De Schepper D, Olieslaeger MD, Knuyt G. Stals LM, Van Stappen M, Malliet B, Celis P, Roos JR. Initial growth and epitaxy of PVD TiN layers on austenitic steel. Thin Solid Films 1989;173:199-208.
-
(1989)
Thin Solid Films
, vol.173
, pp. 199-208
-
-
De Schepper, D.1
Olieslaeger, M.D.2
Knuyt, G.3
Stals, L.M.4
Van Stappen, M.5
Malliet, B.6
Celis, P.7
Roos, J.R.8
-
8
-
-
0022080421
-
Structure and properties of TiN coatings
-
Sundgren JE. Structure and properties of TiN coatings. Thin Solid Films 1985;128:21-44.
-
(1985)
Thin Solid Films
, vol.128
, pp. 21-44
-
-
Sundgren, J.E.1
-
9
-
-
45949127998
-
Young's modulus of TiN TiC, ZrN and HfN
-
Török E, Perry AJ, Chollet JL, Sproul WD. Young's modulus of TiN TiC, ZrN and HfN. Thin Solid Films 1987;153:37-43.
-
(1987)
Thin Solid Films
, vol.153
, pp. 37-43
-
-
Török, E.1
Perry, A.J.2
Chollet, J.L.3
Sproul, W.D.4
-
10
-
-
0025671028
-
A contribution to the study of Poisson's ratios and elastic constants of TiN, ZrN, and HfN
-
Perry AJ. A contribution to the study of Poisson's ratios and elastic constants of TiN, ZrN, and HfN. Thin Solid Films 1990;193-194:463-71.
-
(1990)
Thin Solid Films
, vol.193-194
, pp. 463-471
-
-
Perry, A.J.1
-
11
-
-
0024620131
-
The relationship between residual stress, X-ray elastic constants and lattice parameters in TiN films made by physical vapour deposition
-
Perry AJ. The relationship between residual stress, X-ray elastic constants and lattice parameters in TiN films made by physical vapour deposition. Thin Solid Films 1989;170:63-70.
-
(1989)
Thin Solid Films
, vol.170
, pp. 63-70
-
-
Perry, A.J.1
-
12
-
-
0026898565
-
X-ray residual stress measurement in TiN, ZrN and HffN films using the Seeman-Bohlin method
-
Perry AJ, Valvoda V, Rafaja D. X-ray residual stress measurement in TiN, ZrN and HffN films using the Seeman-Bohlin method. Thin Solid Films 1992;214:169-74.
-
(1992)
Thin Solid Films
, vol.214
, pp. 169-174
-
-
Perry, A.J.1
Valvoda, V.2
Rafaja, D.3
-
13
-
-
36449000853
-
Elastic constants of single-crystal transition-metal nitride films measured by line focus acoustic microscopy
-
Kim JO, Achenbach JD, Mirkarimi PB, Shinn M, Barnett SA. Elastic constants of single-crystal transition-metal nitride films measured by line focus acoustic microscopy. J Appl Phys 1992;72:1805-11.
-
(1992)
J Appl Phys
, vol.72
, pp. 1805-1811
-
-
Kim, J.O.1
Achenbach, J.D.2
Mirkarimi, P.B.3
Shinn, M.4
Barnett, S.A.5
-
14
-
-
0026883413
-
Line focus acoustic microscopy to measure anisotropic acoustic properties of thin films
-
Kim JO, Achenbach JD. Line focus acoustic microscopy to measure anisotropic acoustic properties of thin films. Thin Solid Films 1992;214:25-34.
-
(1992)
Thin Solid Films
, vol.214
, pp. 25-34
-
-
Kim, J.O.1
Achenbach, J.D.2
-
16
-
-
0027836483
-
Elastic behaviour of TiN thin films
-
Elena M, Bonelli M, Bottani CE, Ghislotti G, Miotello A, Mutti P, Ossi PM. Elastic behaviour of TiN thin films. Thin Solid Films 1993;236:209-13.
-
(1993)
Thin Solid Films
, vol.236
, pp. 209-213
-
-
Elena, M.1
Bonelli, M.2
Bottani, C.E.3
Ghislotti, G.4
Miotello, A.5
Mutti, P.6
Ossi, P.M.7
-
18
-
-
0030779448
-
-
Pang W, Stoddart PR, Comins JD. Every AG. Pietersen D, Marais PJ. Int J Refract Met Hard Mater 1997;15:179-85.
-
(1997)
Int J Refract Met Hard Mater
, vol.15
, pp. 179-185
-
-
Pang, W.1
Stoddart, P.R.2
Comins, J.D.3
Every, A.G.4
Pietersen, D.5
Marais, P.J.6
|