Test site thermal control system for at-speed manufacturing testing

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 119-129

  Malinoski, Mark ^a   Knostman, Steve ^a   Maveety, James ^a   Jones, Tom ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SELF HEATING EFFECTS;

COOLING; DIES; FORCED CONVECTION; HEAT CONDUCTION; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS; TEMPERATURE CONTROL; THERMAL EFFECTS; TRANSISTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0032314879     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743145     Document Type: Conference Paper

References (5)