Interfacial thermal resistance. Method of measurement and impact of adhesive

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3582, Issue , 1998, Pages 1030-1035

  Dietz, R L ^a   Anagnostopoulos, S ^a   Hasselman, D P H ^a  

^a Diemat Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; INFRARED DETECTORS; INTERFACES (MATERIALS); LASER APPLICATIONS; PLASTIC ADHESIVES; TEMPERATURE CONTROL; TEMPERATURE MEASUREMENT;

LASER-FLASH METHOD; THERMAL INTERFACE MATERIALS;

ELECTRONICS PACKAGING;

EID: 0032314749     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)