Core test connectivity, communication, & control

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 303-313

  Whetsel, Lee ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORE TESTS;

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE;

INTEGRATED CIRCUIT TESTING;

EID: 0032314555     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)