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Volumn 13, Issue 1-3, 1998, Pages 769-773

Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method

Author keywords

AFM study; Sol gel method; TiO2 films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; HEAT TREATMENT; HYDROLYSIS; POROUS MATERIALS; REFRACTIVE INDEX; SOL-GELS; X RAY DIFFRACTION ANALYSIS; CRYSTAL STRUCTURE; ELLIPSOMETRY; POROSITY; TEXTURES; TITANIUM DIOXIDE; TRANSPARENCY; X RAY CRYSTALLOGRAPHY;

EID: 0032314411     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008673812626     Document Type: Article
Times cited : (36)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.