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Volumn 13, Issue 1-3, 1998, Pages 769-773
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Atomic Force Microscopy Study of TiO2 Films Obtained by the Sol-Gel Method
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Author keywords
AFM study; Sol gel method; TiO2 films
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALLIZATION;
HEAT TREATMENT;
HYDROLYSIS;
POROUS MATERIALS;
REFRACTIVE INDEX;
SOL-GELS;
X RAY DIFFRACTION ANALYSIS;
CRYSTAL STRUCTURE;
ELLIPSOMETRY;
POROSITY;
TEXTURES;
TITANIUM DIOXIDE;
TRANSPARENCY;
X RAY CRYSTALLOGRAPHY;
MONODISPERSED CRYSTALS;
SOL-GEL METHOD;
THERMAL TREATMENTS;
TIO2 FILMS;
TITANIUM OXIDES;
AMORPHOUS FILMS;
POROSITY MEASUREMENT;
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EID: 0032314411
PISSN: 09280707
EISSN: None
Source Type: Journal
DOI: 10.1023/a:1008673812626 Document Type: Article |
Times cited : (36)
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References (17)
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