Versatile BIST: An integrated approach to on-line/off-line BIST

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 910-917

  Karri, Ramesh ^a   Mukherjee, Nilanjan ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

VERSATILE BUILT-IN SELF TEST (VBIST);

BUILT-IN SELF TEST;

EID: 0032314403     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)