Diagnostic techniques for the UltraSPARCTM microprocessors

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 480-486

  Kinra, Anjali ^a   Mehta, Aswin ^a   Smith, Neal ^a   Mitchell, Jackie ^a   Valente, Fred ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CIRCUITS; DATA STORAGE EQUIPMENT; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS;

EMBEDDED MEMORY ARRAYS;

INTEGRATED CIRCUIT TESTING;

EID: 0032314396     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)