메뉴 건너뛰기




Volumn 45, Issue 6 PART 1, 1998, Pages 2727-2736

Emerging radiation hardness assurance (RHA) issues: A NASA approach for space flight programs

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS; PROTON IRRADIATION; RADIATION DAMAGE; SPACE FLIGHT; SPACECRAFT;

EID: 0032314297     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736521     Document Type: Article
Times cited : (49)

References (35)
  • 2
    • 0032097341 scopus 로고    scopus 로고
    • Radiation Effects in Advanced Microelectronics Technologies 45, no. 3,pp. 1339-1354, Jun. 1998.
    • A.M. JohnstonRadiation Effects in Advanced Microelectronics Technologies IEEE Trans, on Nuc/ear Science, voi 45, no. 3,pp. 1339-1354, Jun. 1998.
    • IEEE Trans, on Nuc/ear Science, Voi
    • Johnston, A.M.1
  • 7
    • 0020293786 scopus 로고    scopus 로고
    • W.E. Price, and M.K. GauthierA Comparison of Radiation Damage in Transistors from Cobalt-60 Gamma Rays and 2.2 MeV Electrons 29, no. 6,pp. 1970-1974, Dec. 1982.
    • O.K. Nichols, W.E. Price, and M.K. GauthierA Comparison of Radiation Damage in Transistors from Cobalt-60 Gamma Rays and 2.2 MeV Electrons IEEE Trans, on Nuclear Science, vol NS-29, no. 6,pp. 1970-1974, Dec. 1982.
    • IEEE Trans, on Nuclear Science, Vol NS
    • Nichols, O.K.1
  • 19
    • 0027810886 scopus 로고    scopus 로고
    • S.D. Pinkerton, S.C. Moss. D.C.Mayer, S. LaLumondiere, S.J. Hansel, K.B. Crawford, and W.R. Crain Vol. 40, no. 6,pp. 1838-1845, Dec 1993.
    • R. Koga, S.D. Pinkerton, S.C. Moss. D.C.Mayer, S. LaLumondiere, S.J. Hansel, K.B. Crawford, and W.R. CrainObservations of SEUs in Analog Microciocuits, IEEE Trans, on Nuclear Science, Vol. 40, no. 6,pp. 1838-1845, Dec 1993.
    • Observations of SEUs in Analog Microciocuits, IEEE Trans, on Nuclear Science
    • Koga, R.1
  • 32
    • 0029517909 scopus 로고    scopus 로고
    • The Energy ncjjunilen uf I.iraime Damage Constants in GaAs LEDs for 1 - 500 MeV Protons
    • vol 42, no. 6,pp. 2104-2107. Dec. 1995.
    • A,L, BeirrYi "The Energy ncjjunilen uf I.iraime Damage Constants in GaAs LEDs for 1 - 500 MeV Protons, IEEE Trans, on Nuclear Science, vol 42, no. 6,pp. 2104-2107. Dec. 1995.
    • IEEE Trans, on Nuclear Science
    • Beirryi, A.L.1
  • 33


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.