Investigation into socketed CDM (SDM) tester parasitics

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 301-310

  Chaine, M ^a   Verhaege, K ^a   Avery, L ^a   Kelly, M ^a   Gieser, H ^a   Bock, K ^a   Henry, L G ^a   Meuse, T ^a   Brodbeck, T ^a   Barth, J ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; SEMICONDUCTOR DEVICE MODELS;

CHARGED DEVICE MODELS (CDM); DEVICE UNDER TEST (DUT); SOCKETED DISCHARGE MODEL (SDM) TESTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0032312987     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)