The electrochemical etching of tungsten STM tips

Electrochimica Acta

Volumn 43, Issue 12-13, 1998, Pages 1939-1944

  Kerfriden, Sophie ^a,b   Nahlé, Ayssar H ^a,c   Campbell, Sheelagh A ^a   Walsh, Frank C ^a   Smith, James R ^a  

^a UNIVERSITY OF PORTSMOUTH   (United Kingdom)

^b Inst Univ de Technol de Lannion   (France)

^c AMERICAN UNIVERSITY OF BEIRUT   (Lebanon)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ELECTRIC VARIABLES MEASUREMENT; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; LOADS (FORCES); OXIDES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; TUNGSTEN;

ELECTROCHEMICAL ETCHING; TENSION; TUNGSTEN WIRE;

ETCHING;

EID: 0032312972     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0013-4686(97)00316-2     Document Type: Article

References (8)

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