Cobalt-manganese oxide thin films thermistors obtained by MOD

Proceedings of the International Semiconductor Conference, CAS

Volumn 1, Issue , 1998, Pages 297-300

  Dragoi, V ^a   Alexe, M ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; DEPOSITION; ELECTRIC VARIABLES MEASUREMENT; ENERGY DISPERSIVE SPECTROSCOPY; MORPHOLOGY; NEGATIVE TEMPERATURE COEFFICIENT; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; THERMISTORS; X RAY DIFFRACTION ANALYSIS;

COBALT-MANGANESE OXIDE; METALORGANIC DECOMPOSITION (MOD) METHOD;

SEMICONDUCTING FILMS;

EID: 0032312822     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)