Influence of the device package on the results of CDM tests - consequences for tester characterization and test procedure

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 320-327

  Brodbeck, Tilo ^a   Kagerer, Andreas ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTROSTATICS; SEMICONDUCTOR DEVICE MODELS;

CHARGED DEVICE MODELS (CDM);

INTEGRATED CIRCUIT TESTING;

EID: 0032312819     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)