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Volumn 19, Issue 4, 1998, Pages 579-588
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CVD-SiC manufacturing process reproducibility
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Author keywords
[No Author keywords available]
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Indexed keywords
BENDING STRENGTH;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL MICROSTRUCTURE;
ELECTRIC CONDUCTIVITY OF SOLIDS;
FRACTURE TOUGHNESS;
GRAIN SIZE AND SHAPE;
HARDNESS;
SILICON CARBIDE;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMAL EXPANSION;
WEIBULL DISTRIBUTION;
PROCESS REPRODUCIBILITY;
CERAMIC MATRIX COMPOSITES;
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EID: 0032312564
PISSN: 01966219
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (9)
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References (22)
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