Metrology & methodology of system level ESD testing

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 29-39

  Lin, D ^a   Pommerenke, D ^a   Barth, J ^a   Henry, L G ^a   Hyatt, H ^a   Hopkins, M ^a   Senko, G ^a   Smith, D ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRIC DISCHARGES; ELECTROMAGNETIC FIELDS; ELECTROSTATICS; SIMULATORS;

ELECTROSTATIC DISCHARGE (ESD) TESTING;

ELECTRONIC EQUIPMENT TESTING;

EID: 0032312442     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)