DC substrate coupling between LDMOS and CMOS devices in hyperintegration I technology

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1998, Pages 57-60

  Venkatesan, Vasudev ^a   Nguyen, Quang ^a   Bose, Amitava ^a   Parris, Patrice ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC EQUIPMENT PROTECTION; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT TESTING; MOS DEVICES; SUBSTRATES;

NWELL RINGS; SUBSTRATE CONTACT RINGS;

ELECTRIC INVERTERS;

EID: 0032312157     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)