Effect of film thickness on ferroelectric properties of sol-gel derived Pb(Ti,Nb)O3 type thin films

Integrated Ferroelectrics

Volumn 20, Issue 1-4, 1998, Pages 129-140

  Iijima, T ^a   Onagawa, J ^b   Sanada, N ^a  

^a TOHOKU NATL INDUST RES INSTITUTE   (Japan)

^b TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

Ferroelectric properties; Film thickness; Lead titanate; Niobium doping; Sol gel; Thin film

Indexed keywords

DEGRADATION; DOPING (ADDITIVES); FERROELECTRIC MATERIALS; FERROELECTRICITY; FILM PREPARATION; FIRING (OF MATERIALS); LEAD COMPOUNDS; PERMITTIVITY; PHASE TRANSITIONS; POLARIZATION; RAPID THERMAL ANNEALING; SOL-GELS;

LEAD TITANATE NIOBATE;

DIELECTRIC FILMS;

EID: 0032309902     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589808238776     Document Type: Article

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