Advanced technology for a new NPT-IGBT module design

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1998, Pages 1061-1066

  Miyashita, S ^a   Yoshiwatari, S ^a   Kobayashi, S ^a   Sakurai, K ^a  

^a FUJI ELECTRIC CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES; RELIABILITY; SEMICONDUCTOR DEVICE MANUFACTURE; STRESS ANALYSIS;

NON-PUNCH-THROUGH-INSULATED GATE BIPOLAR TRANSISTOR (NPT-IGBT);

BIPOLAR TRANSISTORS;

EID: 0032309839     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)