IDDQ testing of opens in CMOS SRAMs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 106-111

  Champac, V H ^a   Castillejos, J ^a   Figueras, J ^a  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COST ACCOUNTING; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT TESTING;

OPEN DEFECTS;

RANDOM ACCESS STORAGE;

EID: 0032308949     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)