Operation of power semiconductors at their thermal limit

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1998, Pages 942-953

  Piccone, D E ^a   Rodrigues, R G ^a   Tobin, W H ^a   Willinger, L W ^a   Barrow, J A ^a   Hansen, T A ^a   Zhao, J ^a   Cao, L ^a  

^a Silicon Power Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; HIGH TEMPERATURE PROPERTIES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES; SILICON CARBIDE; THERMAL CYCLING;

POWER SEMICONDUCTORS;

POWER ELECTRONICS;

EID: 0032308848     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (38)