Local measurements in electrochemistry and corrosion technology

Materials Science Forum

Volumn 289-292, Issue PART 1, 1998, Pages 69-76

  De Wit, J H W ^a,b   Van Der Weijde, D H ^a   De Jong, A J ^a   Blekkenhorst, F ^b   Meijers, S D ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b SWINDEN TECHNOLOGY CENTRE   (Netherlands)

Author keywords

AFM; Kelvin Probe; Local Measurements; SRET; SVET

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; MAGNETIC FIELDS; MORPHOLOGY;

KELVIN PROBE; SCANNING REFERENCE ELECTRODE TECHNIQUE (SRET); SCANNING VIBRATING ELECTRODE TECHNIQUE (SVET);

ELECTROCHEMICAL CORROSION;

EID: 0032308771     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.289-292.69     Document Type: Article

References (6)

1. H. Isaacs, Y. Ishikawa, Elec.Techn.Corr.Eng., ed. R. Bahoian. NACE, (1986) p. 17-23
2. G. Binnig, Ultramicroscopy, Vol.42-44, (1992) p.7-15
3. M. Stratmann, Corrosion Science 27, (1987), p.869-872
4. M. Stratmann, Corrosion Science, 32, (1991), p.467-470
5. Castle, J.E., X.F. Yang, J.H. Qiu, P.A. Zhdan, Eur.Symp.on Modif.Pass.Films, 70 (1993)
6. J.H.W. de Wit, D.H. van der Weijde, D.S. Meijers and M.J. Deutekom, Laboratory erxperience with the development of combined Kelvin/SVET equipment, Eurocorr'97, Trondheim, september 1997.