Analysis of oxide reliability data

International Integrated Reliability Workshop Final Report

Volumn , Issue , 1998, Pages 114-134

  Hunter, William R ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; LIFE CYCLE; OXIDES; PROBABILITY DISTRIBUTIONS; RELIABILITY;

GATE OXIDES; QUASI-STATIC LIFETIME TRANSFORMATIONS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0032308601     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)