Prediction of thermal resistance in trench isolated bipolar device structures

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1998, Pages 207-210

  Walkey, D J ^a   Smy, T J ^a   Tran, H ^a   Marchesan, D ^a   Schroter, M ^a  

^a CARLETON UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

TRENCH ISOLATED DEVICE STRUCTURES;

BIPOLAR SEMICONDUCTOR DEVICES;

EID: 0032308481     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)