ATPG in practical and non-traditional applications

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 632-640

  Keller, Brion ^a   McCauley, Kevin ^a   Swenton, Joseph ^a   Youngs, James ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; DESIGN FOR TESTABILITY; LOGIC CIRCUITS; REDUNDANCY;

AUTOMATIC TEST PATTERN GENERATION (ATPG);

AUTOMATIC TESTING;

EID: 0032308110     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)