Evaluation of atomic force microscopy as a probe of nanoscale residual stress via atomistic simulation

Materials Research Society Symposium - Proceedings

Volumn 522, Issue , 1998, Pages 233-238

  Shenderova, O ^a   Mewkill, J ^a   Linehan, P ^a   Brenner, D W ^a   Jarausch, K ^a   Russell, P E ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELASTICITY; MOLECULAR DYNAMICS; NONDESTRUCTIVE EXAMINATION; RESIDUAL STRESSES; STRAIN; STRESS ANALYSIS; STRESS CONCENTRATION;

NANOINDENTATION;

GOLD;

EID: 0032308062     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)