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Volumn 7, Issue 5-6, 1998, Pages 442-451

Critical level statistics at the Anderson transition in four-dimensional disordered systems

Author keywords

Critical phenomena; Level statistics; Localisation; Metal insulator transition

Indexed keywords

CORRELATION METHODS; ELECTRON TRANSITIONS; MATRIX ALGEBRA; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES;

EID: 0032308026     PISSN: 00033804     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3889(199811)7:5/6<442::AID-ANDP442>3.0.CO;2-D     Document Type: Article
Times cited : (41)

References (32)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.