|
Volumn 7, Issue 5-6, 1998, Pages 442-451
|
Critical level statistics at the Anderson transition in four-dimensional disordered systems
a a |
Author keywords
Critical phenomena; Level statistics; Localisation; Metal insulator transition
|
Indexed keywords
CORRELATION METHODS;
ELECTRON TRANSITIONS;
MATRIX ALGEBRA;
PROBABILITY DISTRIBUTIONS;
RANDOM PROCESSES;
ANDERSON TRANSITION;
FINITE SIZE SCALING ANALYSIS;
FOUR-DIMENSIONAL DISORDERED SYSTEMS;
LANCZOS DIAGONALIZATION;
METAL INSULATOR BOUNDARIES;
|
EID: 0032308026
PISSN: 00033804
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-3889(199811)7:5/6<442::AID-ANDP442>3.0.CO;2-D Document Type: Article |
Times cited : (41)
|
References (32)
|