Growth conditions, electrical resistivity, microhardness and thermal properties of Nb5Sn2Ga single crystals synthesized from high-temperature tin solutions

Journal of Alloys and Compounds

Volumn 281, Issue 2, 1998, Pages 160-162

  Okada, Shigeru ^a   Kudou, Kunio ^b   Shishido, Toetsu ^c   Higashi, Iwami ^d   Horiuchi, Hiroyuki ^e   Fukuda, Tsuguo ^c  

^a KOKUSHIKAN UNIVERSITY   (Japan)

^b KANAGAWA UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

^e HIROSAKI UNIVERSITY   (Japan)

Author keywords

Crystal morphology; Electrical resistivity; Nb5Sn2Ga; Single crystal; Sn flux; Thermal properties; Vicker microhardness

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY OF SOLIDS; GALLIUM COMPOUNDS; MICROHARDNESS; NIOBIUM COMPOUNDS; SINGLE CRYSTALS; TERNARY SYSTEMS; TIN COMPOUNDS;

TERNARY COMPOUNDS;

INTERMETALLICS;

EID: 0032307941     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(98)00738-5     Document Type: Article

References (6)

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