Hydrostatic high pressure studies of polymer thick-film resistors

Microelectronics Reliability

Volumn 38, Issue 12, 1998, Pages 1893-1898

  Dziedzic, Andrzej ^a   Magiera, Artur ^b   Winśiewski, Roland ^b  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON BLACK; COMPOSITION EFFECTS; COMPRESSIBILITY OF SOLIDS; ELECTRIC RESISTANCE; HYDROSTATIC PRESSURE; PERCOLATION (SOLID STATE); POLYIMIDES; PRESSURE EFFECTS; SEMICONDUCTOR DEVICE TESTING; THERMAL EFFECTS; THICK FILM DEVICES; VOLUME FRACTION;

THICK FILM RESISTORS;

RESISTORS;

EID: 0032307904     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00200-5     Document Type: Article

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