Transient behaviour of high voltage termination techniques

Proceedings of the International Semiconductor Conference, CAS

Volumn 1, Issue , 1998, Pages 149-152

  Mingues, Corinne ^a   Dragomirescu, Daniela ^a   Charitat, Georges ^a  

^a LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; OVERVOLTAGE PROTECTION; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DIODES;

BIASED RING TERMINATION; VOLTAGE TERMINATION TECHNIQUES;

SEMICONDUCTOR JUNCTIONS;

EID: 0032307824     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)