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Volumn 8, Issue 1-4, 1998, Pages 387-391

Consistent hydrodynamic and Monte-Carlo simulationof SiGe HBTs based on table models for the relaxation times

Author keywords

GHDM; Hetereo Bipolar Transistor (HBT); Hydrodynamics; Monte Carlo; Silicon Germanium (SiGe); Spline model; Transport parameter

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; CRYSTAL LATTICES; ELECTRON TRANSPORT PROPERTIES; HYDRODYNAMICS; MONTE CARLO METHODS; RELAXATION PROCESSES; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING;

EID: 0032307773     PISSN: 1065514X     EISSN: None     Source Type: Journal    
DOI: 10.1155/1998/49783     Document Type: Article
Times cited : (27)

References (5)
  • 4
    • 84889205943 scopus 로고
    • Influence of heat flux on the accuarcy of hydrodynamic models for ultrashort Si MOSFETs
    • Honolulu
    • Bork, I., Jungemann, C., Meinerzhagen, B. and Engl, W. L. (1994). "Influence of heat flux on the accuarcy of hydrodynamic models for ultrashort Si MOSFETs", in NUPAD Tech. Dig., Honolulu, 5.
    • (1994) NUPAD Tech. Dig. , vol.5
    • Bork, I.1    Jungemann, C.2    Meinerzhagen, B.3    Engl, W.L.4
  • 5
    • 84889194793 scopus 로고    scopus 로고
    • To be published
    • To be published at ESSDERC 97.
    • ESSDERC 97


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.