Static test sequence compaction based on segment reordering and accelerated vector restoration

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 954-961

  Bommu, Surendra K ^a   Chakradhar, Srimat T ^a   Doreswamy, Kiran B ^a  

^a NEC LABORATORIES AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; PROBLEM SOLVING; STATIC ELECTRICITY; VECTORS;

VECTOR RESTORATION BASED STATIC COMPACTION TECHNIQUES;

INTEGRATED CIRCUIT TESTING;

EID: 0032307117     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)