Carrier lifetime extraction in fully-depleted SOI devices

IEEE International SOI Conference

Volumn , Issue , 1998, Pages 21-22

  Ernst, T ^a   Cristoloveanu, S ^a   Vandooren, A ^a   Colinge, J P ^a   Rudenko, T E ^a  

^a Grenoble INP Phelma   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DIODES;

CARRIER LIFETIME;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0032307090     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)