Sub-100nm nMOSFETs with direct tunneling thermal, nitrous and nitric oxides

Annual Device Research Conference Digest

Volumn , Issue , 1998, Pages 10-11

  Yeap, Geoffrey C F ^a   Xiang, Qi ^a   Song, Miryeong ^a   Ahmed, Khaled ^a   Bang, David ^a   Ibok, E ^a   Lin, Ming Ren ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; GATES (TRANSISTOR); HOT CARRIERS; LEAKAGE CURRENTS; OXIDES; TRANSCONDUCTANCE;

ELECTRICAL STRESS; HOT CARRIER INJECTION; NITRIC OXIDE; NITROUS OXIDE; ULTRA THIN DIRECT TUNNELING;

MOSFET DEVICES;

EID: 0032306797     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)